Characterization of electron-beam deposited tungsten films on sapphire and silicon
- J.H. Souk
- J.F. O'Hanlon
- et al.
- 1985
- JVSTA
Paper
Publications
3554 results for Materials Discovery
Thermal desorption spectroscopy of Xe at the Si(111) as a local probe for surface structures
- J.W. Bartha
- U. Barjenbruch
- et al.
- 1985
- JVSTA
PaperMatrix inversion for the GR method in surface scattering
- W.A. Schlup
- 1985
- Surface Science
PaperSummary Abstract: Chromium as an inert marker in copper oxidation
- M.A. Frisch
- 1985
- JVSTA
PaperPolymerization of two unsaturated fatty acid esters in Langmuir-Blodgett films as studied by IR spectroscopy
- J. Rabe
- J.F. Rabolt
- et al.
- 1985
- Thin Solid Films
PaperSummary Abstract: Low temperature adsorption and reaction of O2 with Si(111) 7×7
- A.J. Schell-Sorokin
- J.E. Demuth
- 1985
- JVSTA
PaperInverse photoemission from an unoccupied surface state band on Ag(110)
- B. Reihl
- R.R. Schlittler
- et al.
- 1985
- Surface Science
PaperSummary Abstract: Raman scattering at buried semiconductor-metal interfaces
- J.C. Tsang
- 1985
- JVSTA
PaperScanning tunneling microscopy
- G. Binnig
- H. Rohrer
- 1985
- Surface Science
PaperInterfacial reaction between amorphous silicon and palladium thin films
- H.T.G. Hentzell
- P.A. Psaras
- et al.
- 1985
- Materials Letters
Paper