Quantitative experimental determination of the effect of dislocation - dislocation interactions on strain relaxation in lattice mismatched heterostructures
- E.A. Stach
- R. Hull
- et al.
- 1998
- MRS Fall Meeting 1998
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14204 results for Physical Sciences
Very high performance 50 nm CMOS at low temperature
- S.J. Wind
- L.T. Shi
- et al.
- 1999
- IEDM 1999
Issues in modeling small devices
- S.E. Laux
- M.V. Fischetti
- 1999
- IEDM 1999
Temperature and field dependence in polymer light emitting diodes
- L.D. Bozano
- S.A. Carter
- et al.
- 1999
- MRS Spring Meeting 1999
Current-voltage characteristics of single layer polymer light emitting diodes under high intensity electrical excitation
- B. Ruhstaller
- J.C. Scott
- et al.
- 1999
- MRS Spring Meeting 1999
Characterization of thin dielectric films as copper diffusion barriers using triangular voltage sweep
- S. Cohen
- J.C. Liu
- et al.
- 1999
- MRS Spring Meeting 1999
The future of silicide for CMOS contacts
- R.A. Roy
- C. Cabral Jr.
- et al.
- 1999
- MRS Spring Meeting 1999
Classification of the modes of dissociation in immiscible Cu-alloy thin films
- K. Barmak
- G.A. Lucadamo
- et al.
- 1999
- MRS Spring Meeting 1999
Characterization of plated Cu thin film microstructures
- L. Gignac
- K.P. Rodbell
- et al.
- 1999
- MRS Spring Meeting 1999
Mechanisms for microstructure evolution in electroplated copper thin films
- J.M.E. Harper
- C. Cabral Jr.
- et al.
- 1999
- MRS Spring Meeting 1999