Charge trapping at the low- k dielectric-silicon interface probed by the conductance and capacitance techniques
- J.M. Atkin
- E. Cartier
- et al.
- 2008
- Applied Physics Letters
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2344 results at Applied Physics Letters
Ballistic nanoindentation of polymers
- B. Gotsmann
- H. Rothuizen
- et al.
- 2008
- Applied Physics Letters
A dispersive modulator
- Michael M. T. Loy
- 2008
- Applied Physics Letters
Ballistic overshoot in the gradient propagation of bubbles in garnet films
- A.P. Malozemoff
- J.C. Deluca
- 2008
- Applied Physics Letters
Hole injection into silicon nitride: Dark current dependence on electrode materials and insulator thickness
- P.C. Arnett
- D.J. DiMaria
- 2008
- Applied Physics Letters
Empirical corrections to the energy loss of 4He ions in oxides
- J.F. Ziegler
- W.K. Chu
- et al.
- 2008
- Applied Physics Letters
Interface effects and high conductivity in oxides grown from polycrystalline silicon
- D.J. Dimaria
- D.R. Kerr
- 2008
- Applied Physics Letters
Connections and disconnections on integrated circuits using nanosecond laser pulses
- P.W. Cook
- S.E. Schuster
- et al.
- 2008
- Applied Physics Letters
Silicon nitride trap properties as revealed by charge-centroid measurements on MNOS devices
- P.C. Arnett
- B.H. Yun
- 2008
- Applied Physics Letters
Acoustically read pulsed image converter
- Herbert R. Carleton
- 2008
- Applied Physics Letters