Publications

32 results at IEEE Trans Semicond Manuf

Decomposition and analysis of process variability using constrained principal component analysis
- - Ongyeun Cho
  - Daeik D. Kim
  - et al.
- 2008
- IEEE Trans Semicond Manuf
Design considerations for PD/SOI SRAM: Impact of gate leakage and threshold voltage variation
- - Rouwaida Kanj
  - Rajiv V. Joshi
  - et al.
- 2008
- IEEE Trans Semicond Manuf
Ring oscillators for CMOS process tuning and variability control
- - Manjul Bhushan
  - Anne Gattiker
  - et al.
- 2006
- IEEE Trans Semicond Manuf
Capacity planning under demand uncertainty for semiconductor manufacturing
- - Sarah Jean Hood
  - Stuart Bermon
  - et al.
- 2003
- IEEE Trans Semicond Manuf
High yielding self-aligned contact-process for a 0.150-μm DRAM technology
- - Thomas S. Rupp
  - David Dobuzinsky
  - et al.
- 2002
- IEEE Trans Semicond Manuf
The mask error factor in optical lithography
- - Alfred K. Wong
  - Richard A. Ferguson
  - et al.
- 2000
- IEEE Trans Semicond Manuf
Level-specific lithography optimization for 1-Gb DRAM
- - Alfred K. Wong
  - Richard Ferguson
  - et al.
- 2000
- IEEE Trans Semicond Manuf
Methods for job configuration in semiconductor manufacturing
- - Daniel P. Connors
  - David D. Yao
- 1996
- IEEE Trans Semicond Manuf
A queueing network model for semiconductor manufacturing
- - Daniel P. Connors
  - Gerald E. Feigin
  - et al.
- 1996
- IEEE Trans Semicond Manuf
Integrated Processing of MOS Gate Dielectric Structures
- - G.W. Rubloff
  - M. Offenberg
  - et al.
- 1994
- IEEE Trans Semicond Manuf