Coverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffraction
- M. Pomerantz
- A. Segmüller
- et al.
- 1985
- Thin Solid Films
Publications
3525 results for Materials Discovery
Summary Abstract: High resolution synchrotron photoemission study of silicon-metal interfaces
- P.S. Ho
- 1985
- JVSTA
Inverse photoemission from an unoccupied surface state band on Ag(110)
- B. Reihl
- R.R. Schlittler
- et al.
- 1985
- Surface Science
History of the modern cryopump
- M.C. Bridwell
- J.G. Rodes
- 1985
- JVSTA
Summary Abstract: Raman scattering at buried semiconductor-metal interfaces
- J.C. Tsang
- 1985
- JVSTA
Stress modification of WSi2.2 films by concurrent low energy ion bombardment during alloy evaporation
- D.S. Yee
- J. Floro
- et al.
- 1985
- JVSTA
Effect of ion bombardment during deposition on the x-ray microstructure of thin silver films
- T.C. Huang
- G. Lim
- et al.
- 1985
- JVSTA
Electronic structure and properties of silicon-transition metal interfaces
- O. Bisi
- L.W. Chiao
- et al.
- 1985
- Surface Science
Secondary electron effect on power-voltage relationship in rf sputtering
- B. Bumble
- J.J. Cuomo
- 1985
- JVSTA
Interfacial reaction between amorphous silicon and palladium thin films
- H.T.G. Hentzell
- P.A. Psaras
- et al.
- 1985
- Materials Letters