High resolution studies of NiSi2 ultrathin film formation by ion scattering and cross-section tem
- E.J. Van Loenen
- A.E.M.J. Fischer
- et al.
- 1985
- Surface Science
Publications
3547 results for Materials Discovery
High-temperature deformation of a polycrystalline alumina containing an intergranular glass phase
- D.R. Clarke
- 1985
- Journal of Materials Science
Electrostatic adsorbate-adsorbate interactions: The poisoning and promotion of the molecular adsorption reaction
- N.D. Lang
- S. Holloway
- et al.
- 1985
- Surface Science
A helium diffraction study of the p(2 × 2) phase of oxygen on Pd(100)
- K.H. Rieder
- W. Stocker
- 1985
- Surface Science
The crystallization mechanism of high-cordierite glass
- Koichi Watanabe
- Edward A. Giess
- et al.
- 1985
- Journal of Materials Science
High resolution photoemission investigation: The oxidation of W
- Guy Hollinger
- F.J. HimDsel
- et al.
- 1985
- JVSTA
Summary Abstract: Thin films for magnetic recording technology: A review
- J.K. Howard
- 1985
- JVSTA
Summary Abstract: Resistivity-process relationships in TiSi2 formed from Ti-Si reaction couples
- H.-O. Blom
- S. Berg
- et al.
- 1985
- JVSTA
Matrix inversion for the GR method in surface scattering
- W.A. Schlup
- 1985
- Surface Science
Effects of biased cosputtering on resistivity and step coverage in tungsten silicide films
- K.W. Choi
- K.Y. Ahn
- 1985
- JVSTA