Mechanics of microelectronics structures as revealed by X-ray diffraction
- Conal E. Murray
- H. Yan
- et al.
- 2007
- Powder Diffraction
Paper
Publications
14468 results for Physical Sciences
Imaging of the schottky barriers and charge depletion in carbon nanotube transistors
- Marcus Freitag
- James C. Tsang
- et al.
- 2007
- Nano Letters
PaperExperimental determination of the toughness of crack stop structures
- T.M. Shaw
- E. Liniger
- et al.
- 2007
- IITC 2007
Conference paperChip-package-interaction modeling of ultra low-k/copper back end of line
- X.-H. Liu
- T.M. Shaw
- et al.
- 2007
- IITC 2007
Conference paperReliability of Cu interconnects with Ta implant
- J.P. Gambino
- T.D. Sullivan
- et al.
- 2007
- IITC 2007
Conference paperAdvanced Cu/low-k BEOL integration, reliability, and extendibility
- Daniel C. Edelstein
- 2007
- IITC 2007
Conference paperImpact of Cu microstructure on electromigration reliability
- C.-K. Hu
- L. Gignac
- et al.
- 2007
- IITC 2007
Conference paperAn alternative low resistance MOL technology with electroplated rhodium as contact plugs for 32nm CMOS and beyond
- I. Shao
- J.M. Cotte
- et al.
- 2007
- IITC 2007
Conference paperMagnetic brightening of carbon nanotube photoluminescence through symmetry breaking
- Jonah Shaver
- Junichiro Kono
- et al.
- 2007
- Nano Letters
PaperCaBaCuO ultrathin films and junctions
- Detlef Born
- Daniela Stornaiuolo
- et al.
- 2007
- IEEE TAS
Conference paper