Coverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffractionM. PomerantzA. Segmülleret al.1985Thin Solid Films
Summary Abstract: Investigation of the interface chemistry of titanium-tungsten Schottky barrier contacts to silicon by Auger spectroscopyJ.E. LewisM.O. Aboelfotohet al.1985JVSTA
Reactive sputtering of copper and silicon near the sputtering thresholdT.M. MayerJ.M.E. Harperet al.1985JVSTA
Magnetic susceptibility of SbCl5-graphite intercalation compounds. IIY. YosidaK. Satoet al.1985Synthetic Metals
Summary Abstract: The interaction mechanism of inelastic electron tunneling spectroscopy probed by high resolution electron energy loss spectroscopyM. LiehrP.A. Thiryet al.1985JVSTA