Summary Abstract: Chromium as an inert marker in copper oxidation
- M.A. Frisch
- 1985
- JVSTA
Publications
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- Materials Discovery
3482 results for Materials Discovery
Electronic structure and properties of silicon-transition metal interfaces
- O. Bisi
- L.W. Chiao
- et al.
- 1985
- Surface Science
The etching of Cu(100) with Cl2
- Harold F. Winters
- 1985
- JVSTA
Lattice relaxation in aluminum monolayers
- Inder P. Batra
- 1985
- JVSTA
Effect of ion bombardment during deposition on the x-ray microstructure of thin silver films
- T.C. Huang
- G. Lim
- et al.
- 1985
- JVSTA
Interfacial reaction between amorphous silicon and palladium thin films
- H.T.G. Hentzell
- P.A. Psaras
- et al.
- 1985
- Materials Letters
The etching of W(111) with XeF2
- Harold F. Winters
- 1985
- JVSTA
Stress modification of WSi2.2 films by concurrent low energy ion bombardment during alloy evaporation
- D.S. Yee
- J. Floro
- et al.
- 1985
- JVSTA
Summary Abstract: Microstructure and electrical conductivity of plasma deposited gold/fluorocarbon composite films
- J. Perrin
- B. Despax
- et al.
- 1985
- JVSTA
Thermal desorption spectroscopy of Xe at the Si(111) as a local probe for surface structures
- J.W. Bartha
- U. Barjenbruch
- et al.
- 1985
- JVSTA