Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions
- Conal E. Murray
- Z. Ren
- et al.
- 2009
- Applied Physics Letters
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2344 results at Applied Physics Letters
Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films
- C. Van Bockstael
- K. De Keyser
- et al.
- 2009
- Applied Physics Letters
Spatial distribution of oxygen vacancies in Cr-doped SrTiO3 during an electric-field-driven insulator-to-metal transition
- B.P. Andreasson
- M. Janousch
- et al.
- 2009
- Applied Physics Letters
Blech effect in Pb-free flip chip solder joint
- Minhua Lu
- Da-Yuan Shih
- et al.
- 2009
- Applied Physics Letters
Depth-resolved soft x-ray photoelectron emission microscopy in nanostructures via standing-wave excited photoemission
- F. Kronast
- R. Ovsyannikov
- et al.
- 2008
- Applied Physics Letters
Stress gradients induced in Cu films by capping layers
- Conal E. Murray
- Paul R. Besser
- et al.
- 2008
- Applied Physics Letters
Very high- κ ZrO2 with La2O3 (LaGeOx) passivating interfacial layers on germanium substrates
- G. Mavrou
- P. Tsipas
- et al.
- 2008
- Applied Physics Letters
Quantitative coherent diffractive imaging of an integrated circuit at a spatial resolution of 20 nm
- Brian Abbey
- Garth J. Williams
- et al.
- 2008
- Applied Physics Letters
Controlled manipulation of individual vortices in a superconductor
- E.W.J. Straver
- J.E. Hoffman
- et al.
- 2008
- Applied Physics Letters
Plasma fluorination of carbon-based materials for imprint and molding lithographic applications
- M. Schvartzman
- A. Mathur
- et al.
- 2008
- Applied Physics Letters