The effects of microstructure on interface characterization
- R. Ludeke
- 1986
- Surface Science
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- Materials Discovery
3484 results for Materials Discovery
Tunneling microscopy and spectroscopy of semiconductor surfaces and interfaces
- A. Baratoff
- G. Binnig
- et al.
- 1986
- Surface Science
Analyses of Ne-diffraction data from transition-metal surfaces based on charge-density calculations
- M. Baumberger
- K.H. Rieder
- et al.
- 1986
- Surface Science
Oxide characterization and behavior at CuCu and CuCuOx interfaces
- H. Lefakis
- P.S. Ho
- 1986
- Thin Solid Films
Sputtering of multicomponent materials: The diffusion limit
- Antonino Oliva
- Roger Kelly
- et al.
- 1986
- Surface Science
The formation of disilicides from bilayers of Ni/Co and Co/Ni on silicon: Phase separation and solid solution
- T.G. Finstad
- D.D. Anfiteatro
- et al.
- 1986
- Thin Solid Films
The interaction of Sb4 molecular beams with Si(100) surfaces: Modulated-beam mass spectrometry and thermally stimulated desorption studies
- S.A. Barnett
- Harold F. Winters
- et al.
- 1986
- Surface Science
Thin films for magnetic recording technology: A review
- J.K. Howard
- 1986
- JVSTA
Molecular beam study of the dissociative chemisorption of oxygen on W(110)
- Charles T. Rettner
- Lisa A. DeLouise
- et al.
- 1986
- JVSTA
Summary Abstract: Classical trajectory calculations of photon-stimulated desorption of ions from alkali-halides
- R.E. Walkup
- Ph. Avouris
- 1986
- JVSTA