Capture of electrons into Na+-related trapping sites in the SiO2 layer of MOS structures at 77 °K
- D.J. DiMaria
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- et al.
- 2008
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
An investigation of the thermal cycling of Pb-alloy Josephson tunneling gates
- S. Basavaiah
- J.H. Greiner
- 2008
- Journal of Applied Physics
PaperSensitivity of hologram recording in photorefractive media
- Kjell Blotekjaer
- 2008
- Journal of Applied Physics
PaperIon-implantation into As-diffused junctions in Si
- E.H. Bogardus
- 2008
- Journal of Applied Physics
PaperManipulation of 1-μm bubbles with coarse (≳4 μm) overlay patterns
- Y.S. Lin
- G.S. Almasi
- et al.
- 2008
- Journal of Applied Physics
PaperAnalysis of marker motion in thin-film silicide formation
- K.N. Tu
- 2008
- Journal of Applied Physics
PaperRefractive index of BaTiO3 and SrTiO3 films
- M. Wöhlecke
- V. Marrello
- et al.
- 2008
- Journal of Applied Physics
PaperEmission probability of hot electrons from silicon into silicon dioxide
- T.H. Ning
- C.M. Osburn
- et al.
- 2008
- Journal of Applied Physics
PaperHigh-field electron trapping in SiO2
- P. Solomon
- 2008
- Journal of Applied Physics
PaperTheory of hologram formation in photorefractive media
- K. Bløtekjaer
- 2008
- Journal of Applied Physics
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