A General Control-Volume Formulation for Modeling Impact Ionization in Semiconductor Transport
- Steven E. Laux
- Bertrand M. Grossman
- 1985
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
Experimental Study of the Minority-Carrier Transport at the Polysilicon—Monosilicon Interface
- Arnost Neugroschel
- Maurizio Arienzo
- et al.
- 1985
- IEEE T-ED
PaperAn Analytical One-Dimensional Model for Lightly Doped Drain (LDD) MOSFET Devices
- Fang-Shi J. Lai
- Jack Yuan-Chen Sun
- 1985
- IEEE T-ED
PaperTwo-Dimensional Simulation of MODFET and GaAs Gate Heterojunction FET's
- Jeffrey Yuh-Fong Tang
- 1985
- IEEE T-ED
PaperA Fully Scaled Submicrometer NMOS Technology Using Direct-Write E-Beam Lithography
- Matthew R. Wordeman
- April M. Schweighart
- et al.
- 1985
- IEEE T-ED
PaperThe Phase-Shifting Mask II: Imaging Simulations and Submicrometer Resist Exposures
- Marc D. Levenson
- Scott Lindsey
- et al.
- 1984
- IEEE T-ED
PaperTemperature Dependence of FET Properties for Cr-Doped and LEC Semi-Insulating GaAs Substrates
- Thomas W. Hickmott
- 1984
- IEEE T-ED
PaperOutput Structure for Buried-Channel CCD
- Savvas G. Chamberlain
- 1984
- IEEE T-ED
PaperNonuniform Displacement of MOSFET Channel Pinchoff
- Savvas G. Chamberlain
- Asim Husain
- et al.
- 1984
- IEEE T-ED
PaperGeneralized Scaling Theory and Its Application to a 1/4 micrometer MOSFET Design
- Robert H. Dennard
- Matthew R. Wordeman
- 1984
- IEEE T-ED
Paper