Summary Abstract: Polyimide-copper interfaces: Growth sequence dependence and solvent effects
- Steven P. Kowalczyk
- Young H. Kim
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
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- Materials Discovery
3487 results for Materials Discovery
Relative elemental sensitivity factors in secondary neutral mass spectrometry
- A. Wucher
- F. Novak
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Oxidation of a cobalt chromium alloy: An x-ray photoemission spectroscopy study
- David E. Fowler
- Juergen Rogozik
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Complex formation and growth at the Cr and Cu-polyimide interface
- R. Haight
- R.C. White
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Optical analysis of thin-layer electrochemical cells for infrared spectroscopy of adsorbates
- D.S. Bethune
- A.C. Luntz
- et al.
- 1988
- Surface Science
X-ray photoemission spectroscopy characterization of silicon surfaces after CF4/H2magnetron ion etching: Comparisons to reactive ion etching
- Gottlieb S. Oehrlein
- Arthur A. Bright
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Solvent-induced local deformation zones in polyimide films adhered to a rigid substrate
- A.C.M. Yang
- H.R. Brown
- 1988
- Journal of Materials Science
A time resolved study of velocity distributions in pulsed molecular beams
- Benjamin N. Eldridge
- Ming L. Yu
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Magnetoreflectivity study of excitons in molecular-beam epitaxially grown Zn, _ xFe<inf>x</inf>Se crystals
- X. Liu
- A. Petrou
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Diffusion of boron, phosphorus, and arsenic implanted in thin films of cobalt disilicide
- O. Thomas
- P. Gas
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films