Correlation of interface chemistry and growth mode of ce on polyimide (pyromellitic dianhydride-oxydianiline)
- J.G. Clabes
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
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- Materials Discovery
3488 results for Materials Discovery
Image processing techniques for obtaining registration information with scanning tunneling microscopy
- R.J. Wilson
- S. Chiang
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Mechanisms of contaminant particle production, migration, and adhesion
- R.J. Miller
- Douglas W. Cooper
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Comparison between amorphous Ni-Zr alloys formed by solid state reaction and by codeposition
- G.V. Chandrashekhar
- D. Gupta
- et al.
- 1988
- Thin Solid Films
Plasma studies on the Leybold-Heraeus INA3 secondary neutral mass spectrometry system
- A. Wucher
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
The change in Si-AI bonding with metal coverage at the Si(111)^3 xV3-AI interface
- J.S. Nelson
- Inder P. Batra
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
High-rate reactive sputter deposition of zirconium dioxide
- Fletcher Jones
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Preparation and X-ray characterization of superconducting and related Tl2Ba2CuO6 phases
- T.C. Huang
- V.Y. Lee
- et al.
- 1988
- Materials Research Bulletin
Thin film adhesion: New possibilities for interface engineering
- J.E.E. Baglin
- 1988
- Materials Science and Engineering B
Summary Abstract: The role of interface states on Schottky behavior
- G. Jezequel
- A. Taleb-lbrahimi
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films