Microstructure and properties of dual ion beam sputtered tungsten film
- A.S. Kao
- V. Novotny
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Publications
3555 results for Materials Discovery
Electron spin resonance study of metal-nitride-silicon structures: Observation of Si dangling bonds with different configurations and trapping properties in silicon nitride
- D. Jousse
- Jerzy Kanicki
- et al.
- 1989
- Applied Surface Science
PaperThe nature of the dominant deep trap in amorphous silicon nitride films: Evidence for a negative correlation energy
- P. Lenahan
- D.T. Krick
- et al.
- 1989
- Applied Surface Science
PaperRoughness and porosity characterization of carbon and magnetic films through adsorption isotherm measurements
- C.L. Wang
- M.F. Toney
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperMechanisms for success or failure of diffusion barriers between aluminum and silicon
- J.M.E. Harper
- S.E. Harnstram
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperChemical and physical modification of fluoropolymer surfaces for adhesion enhancement: A review
- Lorraine M. Siperko
- Richard R. Thomas
- 1989
- Journal of Adhesion Science and Technology
PaperMetallurgical topics in silicon device interconnections: Thin film stresses
- F.M. D’Heurle
- 1989
- International Materials Reviews
ReviewMagnetic and magneto‐optic thin films and multilayers in San Diego
- Ernesto Marinerom
- Takao Suzuki
- 1989
- Advanced Materials
Conference paperMolecular electronics—science and technology
- Ari Aviram
- 1989
- Advanced Materials
Conference paperElectrical resistivity and structural changes in amorphous Ge1-xAlx thin films under thermal annealing
- F. Catalina
- C.N. Afonso
- et al.
- 1988
- Thin Solid Films
Paper