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Analysis of Coincidence Losses for a Monitor of Particle Contamination on SurfacesDouglas W. CooperRobert J. Miller2019JES
The Influence of Attached Bubbles on Potential Drop and Current Distribution at Gas-Evolving ElectrodesCharles W. Tobias2019JES
A Novel Scheme for Detection of Defects in III-V Semiconductors by CathodoluminescenceLarry M. GlassmanMartin P. Scott2019JES
Combined Experimental and Modeling Study of Spatial Effects in Plasma Etching: CF4/O2 Etching of SiliconM. DalvieK.F. Jensen2019JES