Fault Analysis and Test Generation for Programmable Logic Arrays (PLA's)Daniel L. OstapkoJune Hong Se1979IEEE TC
Associative-Search Bubble Devices for Content-Addressable Memory and Array LogicYoung Lee ShareHsu Chang1979IEEE TC
The Movement and Permutation of Columns- in Magnetic Bubble Lattice FilesAshok K. ChandraC.K. Wong1979IEEE TC
9-V Algorithm for Test Pattern Generation of Combinational Digital CircuitsCharles W. ChaWilliam E. Donathet al.1978IEEE TC