Ta as a barrier for the Cu/PtSi, Cu/Si, and Al/PtSi structures
- Chin-An Chang
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Publications
3556 results for Materials Discovery
X-ray photoelectron spectroscopy and ellipsometry studies of the electrochemically controlled adsorption of benzotriazole on copper surfaces
- S.L. Cohen
- V. Brusic
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperInverse photoemission from semiconductors
- F.J. Himpsel
- 1990
- Surface Science Reports
PaperX-ray reflectivity study of Si02on Si
- A.A. Bright
- G.W. Rubioff
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper(100) and (111) Ni films epitaxially grown on Cu by the metal-metal epitaxy on silicon technique near room temperatures
- Chin-An Chang
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperGap optimization and homogenization of an externally pressurized air bearing
- Michel P. Robert
- Ferdinand Hendriks
- 1990
- Tribology Transactions
PaperScanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surface
- P. Martensson
- R.M. Feenstra
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperThe analysis of complex samples by spectroscopic ellipsometry
- J. Freeouf
- 1990
- Applied Surface Science
PaperKinetics of physical adsorption of ethane on lr(110)-(1 × 2): Molecular beam reflectivity measurements and Monte Carlo simulations
- W.H. Weinberg
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperGrowth of CoSi2on Si(001): Structure, defects, and resistivity
- R.D. Thompson
- S.S. Iyer
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper