Syndrome-Testing of “Syndrome-Untestable” Combinational Circuits
- Jacob Savir
- 1981
- IEEE TC
Paper
Publications
314 results at IEEE TC
Syndrome-Testability Can be Achieved by Circuit Modification
- George Markowsky
- 1981
- IEEE TC
PaperDetection of Single Intermittent Faults in Sequential Circuits
- Jacob Savir
- 1980
- IEEE TC
PaperA Computation Model of Parallel Solution of Linear Equations
- Omar Wing
- John W. Huang
- 1980
- IEEE TC
PaperOn the Complexity of Sortingin Magnetic Bubble Memory Systems
- Kin-Man Chung
- Fabrizio Luccio
- et al.
- 1980
- IEEE TC
PaperConstruction of a Generalized Connector with 5.8 n 1og2n Edges
- K.M. Chung
- C.K. Wong
- 1980
- IEEE TC
PaperA Tradeoff Study of Switching Systems in Computer Communication Networks
- Parviz Kermani
- Leonard Kleinrock
- 1980
- IEEE TC
PaperSyndrome-Testable Design of Combinational Circuits
- Jacob Savir
- 1980
- IEEE TC
PaperMaintaining Sorted Files in a Magnetic Bubble Memory
- Giancarlo Bongiovanni
- Fabrizio Luccio
- 1980
- IEEE TC
PaperTesting for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection
- Jacob Savir
- 1980
- IEEE TC
Paper