Evidence for a parallel path oxidation mechanism at the Si-SiO2 interface
- E.A. Irene
- 1982
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Self-developing photoetching of poly(ethylene terephthalate) films by far-ultraviolet excimer laser radiation
- R. Srinivasan
- V. Mayne-Banton
- 1982
- Applied Physics Letters
PaperEpitaxial NiSi2 formation by pulsed ion beam annealing
- L.J. Chen
- L.S. Hung
- et al.
- 1982
- Applied Physics Letters
PaperLow defect density amorphous hydrogenated silicon prepared by homogeneous chemical vapor deposition
- B.A. Scott
- J.A. Reimer
- et al.
- 1982
- Applied Physics Letters
PaperThermally induced vortex-to-vortex transitions in a superconducting quantum interference device
- M. Naor
- C.D. Tesche
- et al.
- 1982
- Applied Physics Letters
PaperSchottky barrier height measurement by electron-beam induced voltage
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Applied Physics Letters
PaperAblative hole formation process in thin tellurium and tellurium-alloy films
- M. Chen
- V. Marrello
- et al.
- 1982
- Applied Physics Letters
PaperOptical probing technique for inhomogeneous superconducting films
- C.C. Chi
- M.M.T. Loy
- et al.
- 1982
- Applied Physics Letters
PaperUltra-low-noise tunnel junction dc SQUID with a tightly coupled planar input coil
- M.B. Ketchen
- J.M. Jaycox
- 1982
- Applied Physics Letters
PaperOxidation-enhanced or retarded diffusion and the growth or shrinkage of oxidation-induced stacking faults in silicon
- T.Y. Tan
- U. Gösele
- 1982
- Applied Physics Letters
Paper