Contactless measurement of schottky barrier heights using secondary electrons
- H.-C.W. Huang
- P.S. Ho
- 1982
- Applied Physics Letters
Paper
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2351 results at Applied Physics Letters
Are interface states consistent with Schottky barrier measurements
- J. Freeouf
- 1982
- Applied Physics Letters
PaperOn the atomic structure of the Σ = 3, {112} twin in silicon
- C. Fontaine
- D.A. Smith
- 1982
- Applied Physics Letters
PaperOxidation-enhanced or retarded diffusion and the growth or shrinkage of oxidation-induced stacking faults in silicon
- T.Y. Tan
- U. Gösele
- 1982
- Applied Physics Letters
PaperUltra-low-noise tunnel junction dc SQUID with a tightly coupled planar input coil
- M.B. Ketchen
- J.M. Jaycox
- 1982
- Applied Physics Letters
PaperOptical probing technique for inhomogeneous superconducting films
- C.C. Chi
- M.M.T. Loy
- et al.
- 1982
- Applied Physics Letters
PaperAblative hole formation process in thin tellurium and tellurium-alloy films
- M. Chen
- V. Marrello
- et al.
- 1982
- Applied Physics Letters
PaperSchottky barrier height measurement by electron-beam induced voltage
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Applied Physics Letters
PaperOptical pulse compression based on enhanced frequency chirping
- D. Grischkowsky
- A.C. Balant
- 1982
- Applied Physics Letters
PaperThermally induced vortex-to-vortex transitions in a superconducting quantum interference device
- M. Naor
- C.D. Tesche
- et al.
- 1982
- Applied Physics Letters
Paper