Reactive ion etching of Nb/A1Ox/Nb for Josephson technology
- C.-K. Hu
- N.J. Mazzeo
- et al.
- 1991
- Thin Solid Films
Paper
Publications
3555 results for Materials Discovery
A note on the determination of the thermal stresses in multi-metal beams subjected to temperature variations
- A.O. Cifuentes
- 1991
- ASME Journal of Electronic Packaging
PaperReasoning on the location of components for assembly packaging
- J.J. Kim
- D.C. Gossard
- 1991
- Journal of Mechanical Design, Transactions of the ASME
PaperElastoplastic analysis of bimaterial beams subjected to thermal loads
- A.O. Cifuentes
- 1991
- ASME Journal of Electronic Packaging
PaperMicrostructure and electrical characteristics of tungsten and WSix contacts to GaAs
- D.P. Basile
- C.L. Bauer
- et al.
- 1991
- Materials Science and Engineering B
PaperCH4 dissociation on metals: a quantum dynamics model
- A.C. Luntz
- J. Harris
- 1991
- Surface Science
PaperChromium germanides: formation, structure and properties
- N. Lundberg
- M. Östling
- et al.
- 1991
- Applied Surface Science
PaperThe reaction of scandium thin films with silicon: diffusion, nucleation, resistivities
- O. Thomas
- C.S. Petersson
- et al.
- 1991
- Applied Surface Science
PaperSchottky barriers of scandium and scandium monosilicide on silicon
- F.M. d'Heurle
- M.O. Aboelfotoh
- et al.
- 1991
- Applied Surface Science
PaperMorphological instabilities of nickel and cobalt silicides on silicon
- S. Nygren
- D. Caffin
- et al.
- 1991
- Applied Surface Science
Paper