Analysis of high resolution electron microscope images of the Pd2Si-Si interface
- W. Krakow
- 1982
- Thin Solid Films
Paper
Publications
24839 results for Exploratory Science
Electronic structure of silicide-silicon interfaces
- G.W. Rubloff
- P.S. Ho
- 1982
- Thin Solid Films
PaperAn X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces
- Haydn Chen
- G.E. White
- et al.
- 1982
- Thin Solid Films
PaperFormation and structure of epitaxial NiSi2 and CoSi2
- L.J. Chen
- J.W. Mayer
- et al.
- 1982
- Thin Solid Films
PaperLattice imaging of silicide-silicon interfaces
- L.J. Chen
- J.W. Mayer
- et al.
- 1982
- Thin Solid Films
PaperAdsorption and decomposition of ammonia on a W(110) surface: Photoemission fingerprinting and interpretation of the core level binding energies using the equivalent core approximation
- M. Grunze
- C.R. Brundle
- et al.
- 1982
- Surface Science
PaperMonte Carlo renormalization-group study of the Baxter-Wu model
- M.A. Novotny
- D.P. Landau
- et al.
- 1982
- Physical Review B
PaperVoltage noise measurement of the vortex mean free path in superconducting granular tin films
- C.M. Knoedler
- Richard F. Voss
- 1982
- Physical Review B
PaperResonant photoemission study of UNi5-xCux
- Wolf-Dieter Schneider
- B. Reihl
- et al.
- 1982
- Physical Review B
ReviewElectron beam testing and its application to packaging modules for very large scale integrated (vlsi) chip arrays
- F.J. Hohn
- T.H.P. Chang
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paper