Oxidation processes using ion beams
- A.W. Kleinsasser
- J.M.E. Harper
- et al.
- 1982
- Thin Solid Films
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Comparison of the three classes (rare earth, refractory and near-noble) of silicide contacts
- R.D. Thompson
- K.N. Tu
- 1982
- Thin Solid Films
The direct observation of atomic surface structure and inclined planar defects in Au(111) films
- William Krakow
- 1982
- Thin Solid Films
Electron beam study of silicide Schottky diodes
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Thin Solid Films
Radioactive Ni* tracer study of the nickel silicide growth mechanism
- J.E.E. Baglin
- H.A. Atwater
- et al.
- 1982
- Thin Solid Films
An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces
- Haydn Chen
- G.E. White
- et al.
- 1982
- Thin Solid Films
Formation and structure of epitaxial NiSi2 and CoSi2
- L.J. Chen
- J.W. Mayer
- et al.
- 1982
- Thin Solid Films
Lattice imaging of silicide-silicon interfaces
- L.J. Chen
- J.W. Mayer
- et al.
- 1982
- Thin Solid Films
Analysis of high resolution electron microscope images of the Pd2Si-Si interface
- W. Krakow
- 1982
- Thin Solid Films
Electronic structure of silicide-silicon interfaces
- G.W. Rubloff
- P.S. Ho
- 1982
- Thin Solid Films