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The Effects of Pressure, Temperature, and Time on the Annealing of lonizing Radiation Induced Insulator Damage in N-channel IGFET'sA. ReismanC.J. Merz2019JES
Maskless Laser Patterning for Gold Plating of Microelectronic MaterialsR.J. von GutfeldM.H. Gelchinskiet al.2019JES
Calculation of Galvanic Currents and Potentials Using a p-Type Finite Element MethodR.B. Morris2019JES
Composition Determination of Electrodeposited NiSn and PbSn Alloys Using Stripping Voltammetry at a Rotating Ring-Disk ElectrodeK.H. WongP.C. Andricacos2019JES
A Diffusion Model for Electron-Hole Recombination in Zn2SiO4:(Mn, As) PhosphorsD.J. RobbinsN. Caswellet al.2019JES