Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots
- D. Smeets
- J. Demeulemeester
- et al.
- 2008
- Journal of Applied Physics
Publications
Date
Featured collections
Popular topics
2355 results at Journal of Applied Physics
Mechanical behavior of stressed films on anisotropic substrates
- Conal E. Murray
- K.L. Saenger
- 2008
- Journal of Applied Physics
Property modifications of nanoporous pSiCOH dielectrics to enhance resistance to plasma-induced damage
- E. Todd Ryan
- Stephen M. Gates
- et al.
- 2008
- Journal of Applied Physics
Nucleation and diffusion during growth of ternary Co1-x Nix Si2 thin films studied by complementary techniques in real time
- D. Smeets
- J. Demeulemeester
- et al.
- 2008
- Journal of Applied Physics
Thermoluminescence and color centers in rf-sputtered SiO2 films
- T.W. Hickmott
- 2008
- Journal of Applied Physics
Enhanced uniaxial magnetic anisotropy in Fe31Co69 thin films on GaAs(001)
- F. Bianco
- P. Bouchon
- et al.
- 2008
- Journal of Applied Physics
Phase change nanodots patterning using a self-assembled polymer lithography and crystallization analysis
- Yuan Zhang
- Simone Raoux
- et al.
- 2008
- Journal of Applied Physics
Local strain distributions in silicon-on-insulator/stressor-film composites
- Özgür Kalenci
- Conal E. Murray
- et al.
- 2008
- Journal of Applied Physics
Effect of Pt addition on growth stress and thermal stress of NiSi films
- C. Van Bockstael
- K. De Keyser
- et al.
- 2008
- Journal of Applied Physics
Quantitative analysis of complex targets by proton-induced x rays
- W. Reuter
- A. Lurio
- et al.
- 2008
- Journal of Applied Physics