Nondestructive depth profiling of carrier lifetimes in full silicon wafers
- D. Guidotti
- J.S. Batchelder
- et al.
- 1986
- Applied Physics Letters
Publications
2351 results at Applied Physics Letters
Scanning thermal profiler
- C.C. Williams
- H.K. Wickramasinghe
- 1986
- Applied Physics Letters
Hot-electron capture to DX centers in AlxGa1-xAs at low Al mole fractions (x<0.2)
- T.N. Theis
- B.D. Parker
- et al.
- 1986
- Applied Physics Letters
Electron beam evaporation of oriented Nb films onto GaAs crystals in ultrahigh vacuum
- M. Eizenberg
- D.A. Smith
- et al.
- 1986
- Applied Physics Letters
Low-temperature nuclear magnetic resonance with a dc SQUID amplifier
- M.R. Freeman
- R.S. Germain
- et al.
- 1986
- Applied Physics Letters
Nanosecond photoacoustic studies on ultraviolet laser ablation of organic polymers
- P.E. Dyer
- R. Srinivasan
- 1986
- Applied Physics Letters
Stacking faults in WSi2: Resistivity effects
- F.M. d'Heurle
- F.K. LeGoues
- et al.
- 1986
- Applied Physics Letters
Studies of excimer laser ablation of solids using a Michelson interferometer
- R.E. Walkup
- J.M. Jasinski
- et al.
- 1986
- Applied Physics Letters
Influence of sputtering damage on chemical interactions at Cr-SiO 2 interfaces
- A. Cros
- A.G. Schrott
- et al.
- 1986
- Applied Physics Letters
Stability of multilayers for synchrotron optics
- E. Ziegler
- Y. Lepetre
- et al.
- 1986
- Applied Physics Letters