Enhanced "tail" diffusion of phosphorus and boron in silicon: Self-interstitial phenomena
- F.F. Morehead
- R.F. Lever
- 1986
- Applied Physics Letters
Publications
2347 results at Applied Physics Letters
Enhanced grain growth of phosphorus-doped polycrystalline silicon by titanium silicide formation
- T.C. Chou
- C.Y. Wong
- et al.
- 1986
- Applied Physics Letters
Spatial location of electron trapping defects on silicon by scanning tunneling microscopy
- M.E. Welland
- R.H. Koch
- 1986
- Applied Physics Letters
Effect of surface losses on soliton propagation in Josephson junctions
- A. Davidson
- N.F. Pedersen
- et al.
- 1986
- Applied Physics Letters
Ambient dependence of metal diffusion through a less-electronegative metal layer
- Chin-An Chang
- Helen L. Yeh
- 1986
- Applied Physics Letters
Time-of-flight measurements of minority-carrier transport in p-silicon
- D.D. Tang
- F. Fang
- et al.
- 1986
- Applied Physics Letters
Compound materials for reversible, phase-change optical data storage
- M. Chen
- K.A. Rubin
- et al.
- 1986
- Applied Physics Letters
Determination of the interdiffusion of Al and Ga in undoped (Al,Ga)As/GaAs quantum wells
- T.E. Schlesinger
- T.F. Kuech
- 1986
- Applied Physics Letters
Defect formation in thermal SiO2 by high-temperature annealing
- K. Hofmann
- G.W. Rubloff
- et al.
- 1986
- Applied Physics Letters
Low-loss electron images of uncoated photoresist in the scanning electron microscope
- Oliver C. Wells
- 1986
- Applied Physics Letters