Microloop measurements of recording head fields versus current
- Roger F. Hoyt
- 1985
- Journal of Applied Physics
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2355 results at Journal of Applied Physics
Transient capacitance study of electron traps in AlGaAs grown with As 2
- P.M. Mooney
- R. Fischer
- et al.
- 1985
- Journal of Applied Physics
Localization and magnetic properties in cerium compounds
- J.L. Tholence
- P. Haen
- et al.
- 1985
- Journal of Applied Physics
The effect of gate metal and SiO2 thickness on the generation of donor states at the Si-SiO2 interface
- M.V. Fischetti
- Z.A. Weinberg
- et al.
- 1985
- Journal of Applied Physics
Electron heating in silicon dioxide and off-stoichiometric silicon dioxide films
- D.J. DiMaria
- T.N. Theis
- et al.
- 1985
- Journal of Applied Physics
Strain in evaporated Nb thin films
- Masanori Murakami
- Tadashi Yogi
- 1985
- Journal of Applied Physics
Characterization of silicon implanted GaAs buffer layers grown by metalorganic chemical vapor deposition
- T.F. Kuech
- R.M. Potemski
- et al.
- 1985
- Journal of Applied Physics
Effect of arsenic segregation on the electrical properties of grain boundaries in polycrystalline silicon
- C.Y. Wong
- C.R.M. Grovenor
- et al.
- 1985
- Journal of Applied Physics
Self-contained measurement of thin-film superconducting penetration depths and nonsuperconducting film thicknesses in Josephson integrated circuits
- W.H. Henkels
- 1985
- Journal of Applied Physics
Room-temperature oxidation of Ni, Pd, and Pt silicides
- A. Cros
- R.A. Pollak
- et al.
- 1985
- Journal of Applied Physics