High performance extremely thin SOI (ETSOI) hybrid CMOS with Si channel NFET and strained SiGe channel PFET
- K. Cheng
- A. Khakifirooz
- et al.
- 2012
- IEDM 2012
Publications
13 results at IEDM 2012
Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs
- H. Miki
- N. Tega
- et al.
- 2012
- IEDM 2012
Scalable and fully self-aligned n-type carbon nanotube transistors with gate-all-around
- Aaron D. Franklin
- Siyuranga O. Koswatta
- et al.
- 2012
- IEDM 2012