A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)
- Ernest Y. Wu
- James Stathis
- et al.
- 2015
- IRPS 2015
Publications
15 results at IRPS 2015
Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications
- C. Kothandaraman
- X. Chen
- et al.
- 2015
- IRPS 2015
SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2015
- IRPS 2015
A collective relaxation model for resistance drift in phase change memory cells
- Abu Sebastian
- Daniel Krebs
- et al.
- 2015
- IRPS 2015