The measurement of effective complex refractive indices for selected metal silicides
- R.D. Frampton
- E.A. Irene
- et al.
- 1986
- Journal of Applied Physics
Publications
2360 results at Journal of Applied Physics
SiO2-induced substrate current and its relation to positive charge in field-effect transistors
- Z.A. Weinberg
- M.V. Fischetti
- et al.
- 1986
- Journal of Applied Physics
High-purity GaAs grown by molecular-beam epitaxy
- W.I. Wang
- R.F. Marks
- et al.
- 1986
- Journal of Applied Physics
Theory of thin-film orientation by ion bombardment during deposition
- R. Mark Bradley
- James M. E. Harper
- et al.
- 1986
- Journal of Applied Physics
A simple method to determine the pretilt angle of nematic guest-host liquid crystals
- K.H. Yang
- Hiap Liew Ong
- et al.
- 1986
- Journal of Applied Physics
Effect of temperature on electrical and microstructural changes of coevaporated Ir-Si alloy films
- B.Z. Weiss
- K.N. Tu
- et al.
- 1986
- Journal of Applied Physics
Near-field optical-scanning microscopy
- U. Dürig
- D. Pohl
- et al.
- 1986
- Journal of Applied Physics
Ion-induced volatilization (IIV): A method for quantitative measurement of the amounts of perfluoropolyether lubricant on a particulate disk surface and in the media porosity
- J.W. Coburn
- H.F. Winters
- 1986
- Journal of Applied Physics
Origin of thickness oscillations in nucleated thin-film silicides
- R. Mark Bradley
- 1986
- Journal of Applied Physics
Measurement of interface states in palladium silicon diodes
- Howard L. Evans
- Xu Wu
- et al.
- 1986
- Journal of Applied Physics