In situ resistivity measurement of cobalt silicide formation
- G. Ottaviani
- K.N. Tu
- et al.
- 1987
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
The capture barrier of the DX center in Si-doped AlxGa 1-xAs
- P.M. Mooney
- N. Caswell
- et al.
- 1987
- Journal of Applied Physics
PaperLattice imaging of metastable TiSi2
- T.C. Chou
- C.Y. Wong
- et al.
- 1987
- Journal of Applied Physics
PaperSilicon etching mechanisms in a CF4/H2 glow discharge
- Gottlieb S. Oehrlein
- Holly L. Williams
- 1987
- Journal of Applied Physics
PaperOriented growth of ultrathin tungsten films on sapphire substrates
- J.H. Souk
- Armin Segmüller
- et al.
- 1987
- Journal of Applied Physics
PaperGeneration and annealing of defects in silicon dioxide
- A. Reisman
- C.K. Williams
- et al.
- 1987
- Journal of Applied Physics
PaperWSi0.11 Schottky gates for GaAs metal semiconductor field-effect transistors
- A.C. Callegari
- G.D. Spiers
- et al.
- 1987
- Journal of Applied Physics
PaperAtomic force microscope-force mapping and profiling on a sub 100-Å scale
- Y. Martin
- C.C. Williams
- et al.
- 1987
- Journal of Applied Physics
PaperThe relation between positive charge and breakdown in metal-oxide-silicon structures
- Z.A. Weinberg
- T.N. Nguyen
- 1987
- Journal of Applied Physics
PaperA computationally fast, two-dimensional vector hysteresis model
- T.R. Koehler
- 1987
- Journal of Applied Physics
Paper