Electrical characteristics of ultra-thin multi-layers of poly-Si and silicon dioxide
- K.K. Chan
- Y.H. Lee
- et al.
- 1994
- MRS Fall Meeting 1994
Conference paper
Publications
3552 results for Materials Discovery
Geometric and electronic structure of fullerene film growth as a function of coverage
- B. Reihl
- 1994
- MRS Fall Meeting 1994
Conference paperStudies on wear mechanism of ultrathin protective carbon overcoat by micro-wear scan technique
- T.W. Wu
- 1994
- MRS Fall Meeting 1994
Conference paperIn-situ x-ray diffraction and resistivity analysis of CoSi2 phase formation with and without a Ti interlayer at rapid thermal annealing rates
- C. Cabral Jr.
- L. Clevenger
- et al.
- 1994
- MRS Fall Meeting 1994
Conference paperHigh-resolution x-ray diffraction measurements of SiGe/Si structures
- J.L. Jordan-Sweet
- P.M. Mooney
- et al.
- 1994
- MRS Fall Meeting 1994
Conference paperThermal Stability of Self-Assembled Monolayers
- E. Delamarche
- Bruno Michel
- et al.
- 1994
- Langmuir
PaperStructure of Hydrophilic Self-Assembled Monolayers: A Combined Scanning Tunneling Microscopy and Computer Simulation Study
- M. Sprik
- E. Delamarche
- et al.
- 1994
- Langmuir
PaperMeasurement of surface stress during epitaxial growth of Ge on arsenic terminated Si(001)
- A.J. Schell-Sorokin
- R.M. Tromp
- 1994
- Surface Science
PaperNonequilibrium point defects and diffusion in silicon
- S.M. Hu
- 1994
- Materials Science and Engineering R
PaperFacet formation in strained Si1-x Gex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1994
- Surface Science
Paper