Interface and bulk trap generation in metal-oxide-semiconductor capacitors
- D.A. Buchanan
- D.J. DiMaria
- 1990
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Dc-erased edge-noise simulations in thin-film media
- Irene A. Beardsley
- Jian-Gang Zhu
- 1990
- Journal of Applied Physics
PaperMicromagnetics of Co-based media: Experiment and model (invited)
- I.R. McFadyen
- I.A. Beardsley
- 1990
- Journal of Applied Physics
PaperDeep donor levels (DX centers) in III-V semiconductors
- P.M. Mooney
- 1990
- Journal of Applied Physics
PaperFlux lattice behavior in high-Tc materials studied by neutron depolarization
- L. Crow
- R. Goyette
- et al.
- 1990
- Journal of Applied Physics
PaperOxidation and formation mechanisms in disilicides: VSi2 and CrSi2, inert marker experiments and interpretation
- O. Thomas
- L. Stolt
- et al.
- 1990
- Journal of Applied Physics
PaperElectrical and interfacial properties of metal-polyimide-silicon structures
- B. Hahn
- D.Y. Yoon
- 1989
- Journal of Applied Physics
PaperProperties of metal clusters in polymerized hydrocarbon versus fluorocarbon matrices
- C. Laurent
- E. Kay
- 1989
- Journal of Applied Physics
PaperGate dielectric and contact effects in hydrogenated amorphous silicon-silicon nitride thin-film transistors
- Naftali Lustig
- Jerzy Kanicki
- 1989
- Journal of Applied Physics
PaperHigh electron density effects in electron spectroscopies: Consequences for picosecond photoemission and electron-beam sampling
- Rolf Clauberg
- Armin Blacha
- 1989
- Journal of Applied Physics
Paper