Test of structural models for Ag{110}1 2-0 by LEED intensity analysis
- E. Zanazzi
- M. Maglietta
- et al.
- 1983
- JVSTA
Paper
Publications
176 results at JVSTA
Chemical bonding and reactions at Ti/Si and Ti/oxygen/Si interfaces
- R. Blitz
- G.W. Rubloff
- et al.
- 1983
- JVSTA
PaperEffect of surface chemistry and work function in secondary ion mass spectrometry
- Ming L. Yu
- 1983
- JVSTA
PaperVacuum systems for microelectronics
- John F. O’hanlon
- 1983
- JVSTA
PaperSummary Abstract: Cluster formation and the percolation threshold in thin Au films
- R.B. Laibowitz
- E.I. Alessandrini
- et al.
- 1983
- JVSTA
PaperCorrelation between the ion bombardment during film growth of Pd films and their structural and electrical properties
- P. Ziemann
- E. Kay
- 1983
- JVSTA
PaperSummary Abstract: Preparation and properties of granular aluminum in plasma-polymerized matrices
- M. Hecq
- P. Zieman
- et al.
- 1983
- JVSTA
PaperImportance of chain reactions in the plasma deposition of hydrogenated amorphous silicon
- Ivan Haller
- 1983
- JVSTA
PaperSummary Abstract: Crystallographic structure of coevaporated Ni-Al alloy films
- H.T.G. Hentzell
- B. Andersson
- et al.
- 1983
- JVSTA
PaperOxygen chemisorption and oxide formation on Si(111) and Si(100) surfaces
- G. Hollinger
- F.J. Himpsel
- 1983
- JVSTA
Paper