On the Scaling Property of Trench Isolation Capacitance for Advanced High-Performance ECL CircuitsP.F. LuC.T. Chuang1990IEEE T-ED
Low-Temperature Avalanche Multiplication In The Collector-Base Junction Of Advanced N-P-N TransistorsPong-Fei Lu1990IEEE T-ED
Non-linear source/drain effects in amorphous-silicon thin-film transistorsR.R. TroutmanAshutosh Kotwal1989IEEE T-ED
On the Low-Temperature Static and Dynamic Properties of High-Performance Silicon Bipolar TransistorsJohn D. CresslerDenny D. Tanget al.1989IEEE T-ED
Performance degradation due to extrinsic base encroachment in advanced narrow-emitter bipolar circuits—part II: Non-threshold logic circuitsC.T. Chuang1989IEEE T-ED
Electron energy spectroscopy and the observation of ballistic transport of hot electrons in the plane of a 2DEGA. PalevskiM. Heiblumet al.1989IEEE T-ED
VB-7 Non-Linear Source/Drain Effects in Amorphous-Silicon Thin-Film-TransistorsRonald TroutmanAshutosh Kotwal1989IEEE T-ED