Mitigating residual stress in Cu metallization
- Conal E. Murray
- Jean Jordan-Sweet
- et al.
- 2012
- Applied Physics Letters
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A p-type Heusler compound: Growth, structure, and properties of epitaxial thin NiYBi films on MgO(100)
- Rong Shan
- Siham Ouardi
- et al.
- 2012
- Applied Physics Letters
Corrosion of Si-O based porous low-k dielectrics
- A.B. Hall
- G.J. Irvine
- et al.
- 2012
- Applied Physics Letters
Electronically active defects in the Cu 2ZnSn(Se,S) 4 alloys as revealed by transient photocapacitance spectroscopy
- D. Westley Miller
- Charles W. Warren
- et al.
- 2012
- Applied Physics Letters
Impact of gate resistance in graphene radio frequency transistors
- Damon B. Farmer
- Alberto Valdes-Garcia
- et al.
- 2012
- Applied Physics Letters
Multiple implantation and multiple annealing of phosphorus doped germanium to achieve n-type activation near the theoretical limit
- Jeehwan Kim
- Stephen W. Bedell
- et al.
- 2012
- Applied Physics Letters
Characterization of thin epitaxial emitters for high-efficiency silicon heterojunction solar cells
- Bahman Hekmatshoar
- Davood Shahrjerdi
- et al.
- 2012
- Applied Physics Letters
Substrate-induced disorder in V 2O 3 thin films grown on annealed c-plane sapphire substrates
- J. Brockman
- M.G. Samant
- et al.
- 2012
- Applied Physics Letters
High-frequency performance of scaled carbon nanotube array field-effect transistors
- Mathias Steiner
- Michael Engel
- et al.
- 2012
- Applied Physics Letters
Mechanical tensile strain induced gate and substrate currents change in n and p-channel metal-oxide-semiconductor field-effect transistors
- Wangran Wu
- Yu Pu
- et al.
- 2012
- Applied Physics Letters