Imaging performance of multilayer x-ray mirrors
- Eberhard Spiller
- Janusz Wilczynski
- et al.
- 1992
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Charge trapping centers in N-rich silicon nitride thin films
- W.L. Warren
- Jerzy Kanicki
- et al.
- 1992
- Applied Physics Letters
PaperPrecursors for Si atomic layer epitaxy: Real time adsorption studies on Si(100)
- D.D. Koleske
- S. Gates
- et al.
- 1992
- Applied Physics Letters
PaperFormation of two-dimensional arsenic-precipitate arrays in GaAs
- M.R. Melloch
- N. Otsuka
- et al.
- 1992
- Applied Physics Letters
PaperNew method for determining the nonlinear optical coefficients of thin films
- Y. Hase
- K. Kumata
- et al.
- 1992
- Applied Physics Letters
PaperReactive ion etch damages in inverted, trilayer thin-film transistor
- Yue Kuo
- 1992
- Applied Physics Letters
PaperPhotoreflectance characterization of an InP/InGaAs heterojunction bipolar transistor structure
- D. Yan
- Fred H. Pollak
- et al.
- 1992
- Applied Physics Letters
PaperKinetics of nucleation and growth of Si on SiO2 in very low pressure SiH4 chemical vapor deposition
- S.S. Dana
- M. Liehr
- et al.
- 1992
- Applied Physics Letters
PaperSilicon epitaxy from silane by atmospheric-pressure chemical vapor deposition at low temperatures
- P. Agnello
- T.O. Sedgwick
- et al.
- 1992
- Applied Physics Letters
PaperIdentification of an interface defect generated by hot electrons in SiO2
- J.H. Stathis
- D.J. Dimaria
- 1992
- Applied Physics Letters
Paper