Identifying and Removing Artifacts Formed During FIB TEM Sample Preparation of Semiconductor Devices
- Lynne Gignac
- John Bruley
- et al.
- 2025
- AReMS 2025
Talk
Publications
14467 results for Physical Sciences
Foundation models for materials discovery – current state and future directions
- Edward O. Pyzer-Knapp
- Matteo Manica
- et al.
- 2025
- npj Computational Materials
ReviewHigh-Efficiency Continuous Spin-Conduction through NiO/Cu Bilayer Structure
- Biswajit Sahoo
- Christopher Safranski
- et al.
- 2025
- Nano Letters
PaperDefects induce phase transition from dynamic to static rippling in graphene
- Fabian Thiemann
- Camille Scalliet
- et al.
- 2025
- PNAS
PaperQuantum-centric computation of molecular excited states with extended sample-based quantum diagonalization
- Stefano Barison
- Javier Robledo Moreno
- et al.
- 2025
- Quantum Science and Technology
PaperAgentic Mixture-of-Workflows for Multi-Modal Chemical Search
- Tiffany Callahan
- Nathaniel Park
- et al.
- 2025
- arXiv
PaperNano-structured magnetic tunnel junctions as compact, low power integrated entropy sources for advanced computing
- Jonathan Sun
- 2025
- RIEC International Workshop on Spintronics 2025
Invited talkThe Semiconductor Supply Chain in an Era of Low GWP and/or PFAS-Free Gas Chemistries
- 2025
- SPIE Advanced Lithography 2025
Invited talkStochastic dynamics of granular hopper flows: A configurational mode controls the stability of clogs
- David Hathcock
- Sam Dillavou
- et al.
- 2025
- Physical Review E
PaperConsideration on segregation behavior of the surface localization material and the pattern roughness degradation in EUV lithography
- KwangMo Choi
- YunJi Kim
- et al.
- 2025
- SPIE Advanced Lithography 2025
Conference paper