Structural studies of Langmuir-Blodgett multilayers by means of soft X-ray diffraction
- W. Jark
- G. Comelli
- et al.
- 1989
- Thin Solid Films
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Absolute depth profiling of thin film systems by low energy secondary neutral mass spectrometry
- A. Wucher
- H. Oechsner
- et al.
- 1989
- Thin Solid Films
Effect of oxygen on the electrical transport in RuO2
- L. Krusin-Elbaum
- 1989
- Thin Solid Films
Electrical resistivity and structural changes in amorphous Ge1-xAlx thin films under thermal annealing
- F. Catalina
- C.N. Afonso
- et al.
- 1988
- Thin Solid Films
Microhardness and microstructure of ion-beam-sputtered, nitrogen-doped NiFe films
- T.W. Wu
- C. Hwang
- et al.
- 1988
- Thin Solid Films
Characterization of HfBx films deposited by r.f. diode and r.f. magnetron sputtering
- W.-Y. Lee
- Graham Olive
- et al.
- 1988
- Thin Solid Films
Interface interactions relevant to packaging technology
- Chin-An Chang
- 1988
- Thin Solid Films
Effects of deposition conditions on the superconducting properties of r.f. and d.c. magnetron sputter-deposited YBa2Cu3O7-x films
- W.-Y. Lee
- J.R. Salem
- et al.
- 1988
- Thin Solid Films
Quantitative X-ray fluorescence analysis of single-layer and multilayer thin films
- T.C. Huang
- 1988
- Thin Solid Films
Preparation and properties of resistive films
- K.K. Shih
- A. Aviram
- et al.
- 1988
- Thin Solid Films