Phase formation and microstructure changes in tantalum thin films induced by bias sputtering
- Philippe Catania
- Ronnen A. Roy
- et al.
- 1993
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Orientational decay in poled second-order nonlinear optical guest-host polymers: Temperature dependence and effects of poling geometry
- M. Stähelin
- Cecilia A. Walsh
- et al.
- 1993
- Journal of Applied Physics
PaperDepth profiling of the Ge concentration in SiGe alloys using in situ ellipsometry during reactive-ion etching
- G.M.W. Kroesen
- G.S. Oehrlein
- et al.
- 1993
- Journal of Applied Physics
PaperElectron paramagnetic resonance investigation of charge trapping centers in amorphous silicon nitride films
- W.L. Warren
- Jerzy Kanicki
- et al.
- 1993
- Journal of Applied Physics
PaperNonlinear transition shifts in magnetic recording due to interpattern proximity effects
- Yaw-Shing Tang
- Ching Tsang
- 1993
- Journal of Applied Physics
PaperEffect of gas impurity and ion bombardment on stresses in sputter-deposited thin films: A molecular-dynamics approach
- C.C. Fang
- F. Jones
- et al.
- 1993
- Journal of Applied Physics
PaperMicrostructural changes in confined submicrometer aluminum films
- M.L. Chou
- S. Rishton
- et al.
- 1993
- Journal of Applied Physics
PaperCrystallization of coevaporated and ion-irradiated amorphous CoSi 2
- Q.Z. Hong
- K. Barmak
- et al.
- 1993
- Journal of Applied Physics
PaperEffects of a stress field on boron ion implantation damage in silicon
- J.D. Mis
- S. Mader
- et al.
- 1993
- Journal of Applied Physics
PaperMagnetoresistance in (Co10 Å/Cu10 Å)n multilayer films as n increases
- T.S. Plaskett
- T.R. McGuire
- 1993
- Journal of Applied Physics
Paper