The C49 to C54-TiSi2 transformation in self-aligned silicide applications
- R. Mann
- L. Clevenger
- et al.
- 1993
- Journal of Applied Physics
Paper
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2360 results at Journal of Applied Physics
Crystallization of coevaporated and ion-irradiated amorphous CoSi 2
- Q.Z. Hong
- K. Barmak
- et al.
- 1993
- Journal of Applied Physics
PaperElectromigration in Al(Cu) two-level structures: Effect of Cu and kinetics of damage formation
- C.-K. Hu
- M.B. Small
- et al.
- 1993
- Journal of Applied Physics
PaperMicrostructural changes in confined submicrometer aluminum films
- M.L. Chou
- S. Rishton
- et al.
- 1993
- Journal of Applied Physics
PaperThickness dependence of electrodynamic properties of TlCaBaCuO thin films
- J.S. Martens
- V.M. Hietala
- et al.
- 1993
- Journal of Applied Physics
PaperNonlinear transition shifts in magnetic recording due to interpattern proximity effects
- Yaw-Shing Tang
- Ching Tsang
- 1993
- Journal of Applied Physics
PaperSpin-polarized photoemission study of epitaxial Gd(0001) films on W(110)
- H. Tang
- T.G. Walker
- et al.
- 1993
- Journal of Applied Physics
PaperEffects of deposition temperature on the giant magnetoresistance of as-deposited Ag-Co thin films
- W.-Y. Lee
- V.R. Deline
- et al.
- 1993
- Journal of Applied Physics
PaperImpact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
- D.J. DiMaria
- E. Cartier
- et al.
- 1993
- Journal of Applied Physics
PaperX-ray analysis of compositional modulation in Co/Pt multilayer films for magneto-optic recording
- J.A. Bain
- B. Clemens
- et al.
- 1993
- Journal of Applied Physics
Paper