HBT low-noise performance in a 0.18 μm SiGe BiCMOS technology
- D.R. Greenberg
- D. Ahlgren
- et al.
- 1999
- IMS 1999
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26865 results for Science
Properties and decomposition behaviors of reactively sputtered Pt(O) electrode materials
- K.L. Saenger
- S.M. Rossnagel
- 1999
- MRS Proceedings 1999
Conference paperBottom electrode effects in controlling orientation of lead zirconate titanate films deposited by chemical solution deposition
- Deborah A. Neumayer
- Katherine L. Saenger
- et al.
- 1999
- MRS Proceedings 1999
Conference paperModified edge lift-off test: Experimental modifications for multifilm systems
- J.C. Hay
- E. Liniger
- et al.
- 2000
- MRS Online Proceedings Library
Conference paperLow temperature hydrogen induced degradation of (Ba,Sr)TiO3 thin film capacitors
- J.D. Baniecki
- C. Parks
- et al.
- 1999
- MRS Proceedings 1999
Conference paperFPGA-based coprocessor for text string extraction
- N.K. Ratha
- A.K. Jain
- et al.
- 2000
- Workshop CAMP 2000
Conference paperMicro-wear scan test on the carbon overcoats as thin as 6 nm or less
- T.W. Wu
- Thomas W. Scharf
- et al.
- 2000
- MRS Online Proceedings Library
Conference paperA high reliability Metal Insulator Metal capacitor for 0.18 μm Copper technology
- M. Armacost
- A. Augustin
- et al.
- 2000
- IEDM 2000
Conference paperMINING EVENT DATA FOR ACTIONABLE PATTERNS
- Joseph L. Hellerstein
- Sheng Ma
- 2000
- CMG 2000
Conference paperUsing Capacity Space Methodology for Balancing Server Utilization: Description and Case Studies
- Bucky Pope
- Lily Mummert
- 2000
- CMG 2000
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