Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formation
- S.S. Lau
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- Thin Solid Films
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Publications
14469 results for Physical Sciences
X-ray photoelectron spectra and electronic structure of zirconium trisulfide and triselenide
- F. Jellinek
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- 1974
- Materials Research Bulletin
PaperDynamics of jahn-teller phase transitions
- E. Pytte
- 1974
- Ferroelectrics
PaperField Effect Modulated Photoluminescence in ZnO
- T.O. Sedgwick
- 1974
- JES
PaperPhosphorus Diffusion in Partially Crystallized Films of SiO2
- D.R. Campbell
- E.I. Alessandrini
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- 1974
- JES
PaperThe temperature dependence of garnet liquid phase epitaxial growth kinetics
- R. Ghez
- E.A. Giess
- 1974
- Journal of Crystal Growth
PaperComments regarding the determination of the structure of c(2 × 2) sulfur overlayers on Ni(001)
- J.E. Demuth
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- 1974
- Surface Science
PaperForm Birefringence in a Sodium Borosilicate Glass
- TAKESHI TAKAMORI
- 1974
- JACerS
PaperElectrolysis method of intercalation of layered transition metal dichalcogenides
- G.V.Subba Rao
- J.C. Tsang
- 1974
- Materials Research Bulletin
PaperM.4 Tunable Vacuum UV Generation Using Resonantly Enhanced Parametric Interactions
- R.T. Hodgson
- P.P. Sorokin
- et al.
- 1974
- IEEE JQE
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