Integrating DfM components into a cohesive design-to-silicon solution
- Lars Liebmann
- Dan Maynard
- et al.
- 2005
- Microlithography 2005
Conference paper
Publications
3605 results for Mathematical Sciences
Toward through-process layout quality metrics
- Fook-Luen Heng
- Jin-Fuw Lee
- et al.
- 2005
- Microlithography 2005
Conference paperThe problem of optimal placement of Sub-Resolution Assist Features (SRAF)
- Maharaj Mukherjee
- Scott Mansfield
- et al.
- 2005
- SPIE Advanced Lithography 2005
Conference paperEmbracing the giant component
- Abraham D. Flaxman
- David Gamarnik
- et al.
- 2005
- Random Structures and Algorithms
PaperOn the use of error propagation for statistical validation of computer vision software
- Xufei Liu
- Tapas Kanungo
- et al.
- 2005
- IEEE Transactions on Pattern Analysis and Machine Intelligence
ReviewResist blur and line edge roughness
- Gregg M. Gallatin
- 2005
- SPIE Advanced Lithography 2005
Conference paperFirst microprocessors with immersion lithography
- D. Gil
- T. Bailey
- et al.
- 2005
- SPIE Advanced Lithography 2005
Conference paperOn weak convergence of iterates in quantum Lp-spaces (p ≥ 1)
- Genady Ya. Grabarnik
- Alexander A. Katz
- et al.
- 2005
- International Journal of Mathematics and Mathematical Sciences
PaperPerformance of product codes on channels with memory
- Sundararajan Sankaranarayanan
- Evangelos Eleftheriou
- 2005
- ISIT 2005
Conference paperBounds on the ergodic capacity of training-based multiple-antenna systems
- Simeon Furrer
- Dirk Dahlhaus
- 2005
- ISIT 2005
Conference paper