The role of Cu distribution and Al2Cu precipitation on the electromigration reliability of submicrometer Al(Cu) lines
- E.G. Colgan
- K.P. Rodbell
- 1994
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Magnetothermopower of Co/Cu1-xNix multilayers
- Jing Shi
- E. Kita
- et al.
- 1994
- Journal of Applied Physics
PaperHot-electron-induced hydrogen redistribution and defect generation in metal-oxide-semiconductor capacitors
- D.A. Buchanan
- A.D. Marwick
- et al.
- 1994
- Journal of Applied Physics
PaperInvestigation of the magnetization reversal mode for individual ellipsoidal single-domain particles of γ-Fe2O3
- C. Salling
- R. O'Barr
- et al.
- 1994
- Journal of Applied Physics
PaperIon-beam-assisted etching of Si with fluorine at low temperatures
- C.B. Mullins
- J.W. Coburn
- 1994
- Journal of Applied Physics
PaperTexture in multilayer metallization structures
- D.P. Tracy
- D.B. Knorr
- et al.
- 1994
- Journal of Applied Physics
PaperExperimental investigation of dichroism sum rules for V, Cr, Mn, Fe, Co, and Ni: Influence of diffuse magnetism
- W.L. O'Brien
- B.P. Tonner
- et al.
- 1994
- Journal of Applied Physics
PaperCoexistence of Brillouin and Van Vleck spin exchange in Zn 1-xMnxSe/Zn1-yFeySe spin superlattice structures
- B.T. Jonker
- H. Abad
- et al.
- 1994
- Journal of Applied Physics
PaperFilm stress of sputtered W/C multilayers and strain relaxation upon annealing
- J.F. Geisz
- T.F. Kuech
- et al.
- 1994
- Journal of Applied Physics
PaperElectrical transport properties of Cu3Ge thin films
- M.O. Aboelfotoh
- K.N. Tu
- et al.
- 1994
- Journal of Applied Physics
Paper