Colossal magnetoresistance in the antiferromagnetic La0.5Ca0.5MnO3 system
- G.Q. Gong
- C.L. Canedy
- et al.
- 1996
- Journal of Applied Physics
Publications
2360 results at Journal of Applied Physics
Degradation and failure of MEH-PPV light-emitting diodes
- J.C. Scott
- J.H. Kaufman
- et al.
- 1996
- Journal of Applied Physics
The role of texture in the electromigration behavior of pure aluminum lines
- D.B. Knorr
- K.P. Rodbell
- 1996
- Journal of Applied Physics
Three-dimensional imaging with a nuclear magnetic resonance force microscope
- O. Züger
- S.T. Hoen
- et al.
- 1996
- Journal of Applied Physics
Two-dimensional profiling of shallow junctions in Si metal-oxide-semiconductor structures using scanning tunneling spectroscopy and transmission electron microscopy
- E.T. Yu
- K. Barmak
- et al.
- 1996
- Journal of Applied Physics
Amorphous (Mo, Ta, or W)-Si-N diffusion barriers for Al metallizations
- J.S. Reid
- E. Kolawa
- et al.
- 1996
- Journal of Applied Physics
In situ scanning electron microscope comparison studies on electromigration of Cu and Cu(Sn) alloys for advanced chip interconnects
- K.-L. Lee
- C.-K. Hu
- et al.
- 1995
- Journal of Applied Physics
Finite-element stress analysis of failure mechanisms in a multilevel metallization structure
- L.T. Shi
- K.N. Tu
- 1995
- Journal of Applied Physics
Near-threshold laser sputtering of gold
- Ted D. Bennett
- Costas P. Grigoropoulos
- et al.
- 1995
- Journal of Applied Physics
Interface states induced by the presence of trapped holes near the silicon-silicon-dioxide interface
- D.J. DiMaria
- D.A. Buchanan
- et al.
- 1995
- Journal of Applied Physics