Control of the axis of chemical ordering and magnetic anisotropy in epitaxial FePt films
- R.F.C. Farrow
- D. Weller
- et al.
- 1996
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Degradation and failure of MEH-PPV light-emitting diodes
- J.C. Scott
- J.H. Kaufman
- et al.
- 1996
- Journal of Applied Physics
PaperThe role of texture in the electromigration behavior of pure aluminum lines
- D.B. Knorr
- K.P. Rodbell
- 1996
- Journal of Applied Physics
PaperTwo-dimensional profiling of shallow junctions in Si metal-oxide-semiconductor structures using scanning tunneling spectroscopy and transmission electron microscopy
- E.T. Yu
- K. Barmak
- et al.
- 1996
- Journal of Applied Physics
PaperThree-dimensional imaging with a nuclear magnetic resonance force microscope
- O. Züger
- S.T. Hoen
- et al.
- 1996
- Journal of Applied Physics
PaperAmorphous (Mo, Ta, or W)-Si-N diffusion barriers for Al metallizations
- J.S. Reid
- E. Kolawa
- et al.
- 1996
- Journal of Applied Physics
PaperIn situ scanning electron microscope comparison studies on electromigration of Cu and Cu(Sn) alloys for advanced chip interconnects
- K.-L. Lee
- C.-K. Hu
- et al.
- 1995
- Journal of Applied Physics
PaperInvestigation of titanium silicide formation in Ti+Si reactions using infrared spectroscopy and x-ray diffraction
- K.L. Saenger
- C. Cabral Jr.
- et al.
- 1995
- Journal of Applied Physics
PaperFinite-element stress analysis of failure mechanisms in a multilevel metallization structure
- L.T. Shi
- K.N. Tu
- 1995
- Journal of Applied Physics
PaperRole of the chamber wall in low-pressure high-density etching plasmas
- James A. O'Neill
- Jyothi Singh
- 1995
- Journal of Applied Physics
Paper