Buried oxide channel field effect transistor
- J. Misewich
- A.G. Schrott
- 2000
- MRS Proceedings 2000
Conference paper
Publications
3552 results for Materials Discovery
Optimizing fabrication of buried oxide channel field effect transistors
- A.G. Schrott
- J. Misewich
- et al.
- 2000
- MRS Proceedings 2000
Conference paperNovel low-k dual-phase materials prepared by PECVD
- A. Grill
- V.V. Patel
- 2000
- MRS Proceedings 2000
Conference paperMetallic adhesion forces and tunneling between atomically defined tip and sample
- A. Schirmeisen
- G. Cross
- et al.
- 2000
- Applied Surface Science
PaperPlasma-induced surface segregation and oxidation in nickel-iron thin films
- R. Hsiao
- D. Mauri
- 2000
- Applied Surface Science
PaperGeneralized stacking fault energies for embedded atom FCC metals
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- 2000
- Modelling and Simulation in Materials Science and Engineering
PaperOxygen stoichiometry in PdOx and PdOxPt electrode layers during processing of ferroelectric and high-epsilon perovskites
- K.L. Saenger
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- et al.
- 2000
- Journal of Materials Research
PaperOptimization of Ta-Si-N thin films for use as oxidation-resistant diffusion barriers
- C. Cabral
- K.L. Saenger
- et al.
- 2000
- Journal of Materials Research
PaperTaming the ground-state and optical properties of transition metal oxides
- O. Bengone
- M. Alouani
- et al.
- 2000
- Computational Materials Science
PaperRelative adhesion measurement for thin film microelectronics structures
- L.P. Buchwalter
- 2000
- Journal of Adhesion
Paper